Building and Validating Atomic Models for Cryo-EM Density Maps
نویسندگان
چکیده
منابع مشابه
Model-based local density sharpening of cryo-EM maps
Atomic models based on high-resolution density maps are the ultimate result of the cryo-EM structure determination process. Here, we introduce a general procedure for local sharpening of cryo-EM density maps based on prior knowledge of an atomic reference structure. The procedure optimizes contrast of cryo-EM densities by amplitude scaling against the radially averaged local falloff estimated f...
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NATURE METHODS | VOL.11 NO.1 | JANUARY 2014 | 63 critical because local resolution tests are repeated at many points in the volume. Additionally, there is data dependency between neighboring points that windowed FSC does not account for. We propose a mathematical theory and an efficient algorithm for measuring local resolution that address all of the above limitations. The theory (Online Method...
متن کاملModeling Beta-Traces for Beta-Barrels from Cryo-EM Density Maps
Cryo-electron microscopy (cryo-EM) has produced density maps of various resolutions. Although α-helices can be detected from density maps at 5-8 Å resolutions, β-strands are challenging to detect at such density maps due to close-spacing of β-strands. The variety of shapes of β-sheets adds the complexity of β-strands detection from density maps. We propose a new approach to model traces of β-st...
متن کاملTracing beta strands using StrandTwister from cryo-EM density maps at medium resolutions.
Major secondary structure elements such as α helices and β sheets can be computationally detected from cryoelectron microscopy (cryo-EM) density maps with medium resolutions of 5-10 Å. However, a critical piece of information for modeling atomic structures is missing, because there are no tools to detect β strands from cryo-EM maps at medium resolutions. We propose a method, StrandTwister, to d...
متن کاملAtomic resolution structure determination by the cryo-EM method MicroED.
The electron cryo-microscopy (cryoEM) method MicroED has been rapidly developing. In this review we highlight some of the key steps in MicroED from crystal analysis to structure determination. We compare and contrast MicroED and the latest X-ray based diffraction method the X-ray free-electron laser (XFEL). Strengths and shortcomings of both MicroED and XFEL are discussed. Finally, all current ...
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ژورنال
عنوان ژورنال: Microscopy and Microanalysis
سال: 2016
ISSN: 1431-9276,1435-8115
DOI: 10.1017/s1431927616011247